Nanoindenter is designed for studies of the mechanical properties of various materials. It allows to measure Young's modulus and hardness of nanoscale films. Naoindenter is equipped with atomic force microscope for studies of the surface topography.

Specification:

max. force: 10 mN, max. displacement: 0.005 mm.

Attachments:

AFM/MFM microscope, nanoECR transducer, AE transducer.