University of Silesia Laboratories

Laboratory of Scanning Electron Microscopy

Wydziałowe Laboratorium Skaningowej Mikroskopii Elektronowej -- Aparatura [en].

Ultra-High Resolution Cold Field Emission UHR FE-SEM Hitachi SU 8010 equipped with energy dispersive X-ray spectrometer EDS (Thermo Scientific NORAN System 7) and Pol

UHR FE-SEM Hitachi Su 8010: cold field-emission source for high resolution and beam current, SE image resolution 1nm (15 kV), accelerating voltage 0.1-30 kV, vacuum in specimen chamber ~10-4Pa, magnification 20-800.000X, computer controlled FE SEM with totally automated 5-axis specimen stage, detectors SE (L), SE (U), BSE, TE, mixed signals SE + BSE, HA-BSE and LA-BSE.

Additional devices: energy dispersive X-ray spectrometer EDS Thermo Scientific NORAN System 7 and PolarPrep PP2000 Cryo-Transfer System (Quorum Technologies).

Scanning electron microscope Tesla BS 340.

Tesla BS 340. Parameters: high vacuum (HV), SE detector, accelerating voltage 5-30 kV, digital image acquisition (Microsystem SEM Framegrabber).

Critical Point Dryer Pelco CPD 2.

Critical Point Dryer Pelco CPD for drying of soft and hydrated biological samples.

Sputter Coater Pelco SC-6.

Sputter Coater Pelco SC-6. Coating samples with a thin layer of gold to prevent electron beam damage and sample charging effects in the SE microscope.