X-Ray Photoelectron Spectrometer (XPS) from the VGScienta and PREVAC company. The spectrometer is used for the chemical analysis of surface of organic or inorganic materials. It is realized via the analysis of kinetic energy of photoelectron emitted from the surface caused by irradiation of the sample surface with the beam of monochromated X-Rays.

hν = KE+BE+W
(hν  - X-Ray energy, KE – kinetic energy, BE – binding energy, W – work function).

In particular spectrometer XPS allows to: identify elements presented in characterized material (with exception of hydrogen and helium), a quantitative analysis of chemical composition,  and a chemical state analysis (including valence state). In general it allows determining the electronic structure of the surface of analyzed material but also to study the arrangement of atoms (and chemical states) in the outermost layers of the surface. Additional equipment such as ion gun allows obtaining information about distribution of elements or phases in depth.

Technical specifications:
- Analysis possible for any organic or inorganic material in a  bulk, thin films, powder or cross-sections form, …
- X-Ray lamp with Al anode (hν=1486.74eV), 
- Monochromator, 
- Energetic resolution ~300meV,
- Depth resolution (depth probe size) ~3nm,
- Detection limits  ~0.01 – 1% sub-monolayer,
- Analysis area: dependent on the choice of the slot ranging from30 to 400μm,
- Depth profiling, ion gun (Ar), 
- Measurements realized in UHV conditions (~10-9Tora),
- Measurements in low (-150°C) and high (2000°C) temperatures,
- Multi-axis manipulator, 
- Software for data acquisition (SES) and data analysis (CasaXPS).

Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS.5, IonTOF GmbH) reflectron-type spectrometer equipped with a bismuth liquid metal ion gun (LMIG). 
The TOF-SIMS is a surface sensitive analytical technique which allows obtaining information about molecular and elemental species present on the surface of characterized material. The spectrometer is used for the chemical analysis of organic and inorganic materials. The chemical information is obtained via the analysis of mass of secondary ions emitted from a sample surface caused by a bombardment of highly focuses, pulsed beam of primary ions (produced in LMIG). 
The spectrometer provides information about molecular and elemental species (including isotopes) of all elements from periodic table. The detection limits are at the level of ppm for most of the elements. Besides determining the presence of particular element, chemical compound the spectrometer allows to obtain chemical maps or more precisely the distribution maps of all secondary ions. This can be realized in 2D and 3D modes (surface imaging or depth profiling mode).

Technical specifications:
- Analysis possible for any organic or inorganic material in a  bulk, thin films, powder or cross-section form, …
- Analysis gun - Liquid Metal Ion Gun (LMIG): Bi+, Bi3+, Bi3++
- Linear resolution up to 80 nm,
- Depth resoulution  ~5Å, 
- Detection limits 107 - 1010 at/cm2  sub-monolayer
- Analysis area: typically from 5 to 500µm, with the use of stage scan analysis of 4x5cm is also available
- Depth profiling (with the use of Cs, O, Ar ion guns) up to several microns
- Measurements realized in UHV conditions (~10-9Tora),
- Measurements in low (-150°C) and high (500°C) temperatures,
- Possibility of cooling down (-150°C)and heating up (600°C) samples in preparation chamber (important for biological samples, or wet samples which are not compatible with UHV conditions),
- Multi-axis manipulator, 
- Software for data acquisition and analysis SurfaceLab6.